Packaging & Test · Design
Package & Substrate Design
Package selection, substrate stack-up, ball maps, and SI, PI, and thermal co-simulation for flip-chip BGA, SiP, and chiplet designs.
What it is
Above a few hundred balls, the package stops being a container and becomes a circuit. Stack-up, ball map, and power delivery decide whether the DDR and SerDes links close, and they're cheapest to fix before the substrate is built.
We design the package and substrate alongside the die and the board: package and material selection, stack-up, ball map, impedance, and substrate layout, checked with chip-package-substrate co-simulation. The same team designs the board it lands on, so the ball map is planned against the breakout.
Inside a SiP
A system-in-package in section: a flip-chip die, a wire-bonded die stack, and passives on one substrate, molded as a single part.
- 1Flip-chip dieBumped face down onto the substrate
- 2Stacked dieTwo die, wire-bonded in one footprint
- 3PassivesSMT capacitors and resistors inside the package
- 4Mold compoundOne molded body over everything
- 5SubstrateRoutes every die to the ball array
- 6Solder ballsOne BGA footprint on the board
Capabilities
- Custom design
- Package selection
- Substrate and material selection
- Stack-up and ball-map design
- Impedance design
- Substrate layout
- Simulation
- Power and ground, DC and AC
- High-speed and system-level channel simulation
- Thermal performance
- Structural design and stress
- EMI, SI, and PI co-optimization
- Advanced integration
- System-in-package: side by side, stacked die, IC plus passives
- Wire bond, flip chip, and SMT in one package
- TSV 2.5D interposer design
- Chiplet-based micro-systems and heterogeneous integration
- DDR3 and Flash wafer-level packaging with bumping
- Substrates
- High-speed BGA substrate design and fabrication
- Organic substrates, BT and ABF build-up
- Multilayer ceramic substrates
Representative builds
Packages designed and built on our bench, client details removed.
| Build | Package and substrate | Size and balls | Key interfaces |
|---|---|---|---|
| CPU + FPGA network processor | HFcBGA, 10-layer organic | 61×61 mm, 3,576 balls | DDR3 1,600 Mbps, PCIe 2.0, XAUI 6.25 Gbps |
| CPU + FPGA + Flash SiP | HFcBGA, 10-layer organic | 50×50 mm, 2,089 balls | PCIe x16 3.0, DDR3 x72, USB 2.0 |
| Integrated DSP module | HFcBGA, 10-layer organic | 35×35 mm, 1,024 balls | 4×72-bit DDR3, PCIe 3.0, 10.125 Gbps SerDes, 60 W, 8 GB DDR4 inside |
| AI chip for healthcare | fcBGA, 10-layer organic | 23×23 mm, 529 balls | LPDDR4 at 4,266 MHz |
| Fibre Channel switch | fcBGA, 6-layer organic | 19×19 mm, 529 balls | Multiple 12.5 Gbps SerDes |
| Mixed-signal RF transceiver SoC | fcBGA, 8-layer ABF build-up | 15×15 mm, 289 balls | 16 Gbps SerDes, 1.5 GHz ADC input |
| AD/DA SiP | BGA, 6-layer BT | 27×27 mm, 636 balls | 3-tier gold-wire fan-out, 1 digital + 4 ADC + 1 DAC + Flash |
| Health-monitoring SiP | Package-on-package, 4-layer organic | 18×18 mm, 393 balls | Copper-core-ball interposer, several mixed-signal die |
Quality systems
ISO 9001
Quality management
ISO 14001
Environmental management
ISO 45001
Occupational health & safety
Packaging and test performed in ISO 9001, ISO 14001, and ISO 45001-certified facilities. Certificates available under NDA.
Common questions
- Can you design the substrate if we only have the die?
- Yes. Package selection, stack-up, ball map, and substrate layout start from the die pad map and the board it has to land on.
- Do you simulate before the substrate is built?
- Yes. Chip, package, and substrate are co-simulated for signal integrity, power integrity, thermal behavior, and structural stress.
- Do you do SiP and chiplet designs?
- Yes: side-by-side and stacked-die SiP, IC plus passives, mixed wire bond, flip chip, and SMT, plus TSV 2.5D interposer and chiplet-based designs.
More packaging & test
Packaging, Test & Failure Analysis
Quick-turn packaging, reliability qualification, and failure analysis built for NPI: one team from first silicon to a qualified part on a working board.
Quick-Turn Ceramic Packaging
Small-batch ceramic DIP, QFP, QFN, LCC, PGA, SiP, and BGA packages for engineering samples, MPW die, and parts that need to survive characterization.
Quick-Turn Plastic Packaging
Small-batch molded packages from 3-pin SOT to 256-pin LQFP, so engineering samples ship in the package production will use.
Reliability Qualification & Electrical Test
HTOL, HAST, THB, temperature cycling, ESD, and latch-up for new parts, plus the burn-in boards and DUT cards to run them.
Failure Analysis & FIB Circuit Edit
FIB circuit edit down to 28nm, decap, delayering, and SEM imaging, so a first-silicon bug can be proven and patched before the next tape-out.
Wafer Thinning, Dicing & Die Sort
Thinning to 50 µm, laser and blade dicing, SiC stealth dicing, GaAs laser dicing, and automated die sort for MPW, shuttle, and full wafers.