Packaging & Test · Plastic
Quick-Turn Plastic Packaging
Small-batch molded packages from 3-pin SOT to 256-pin LQFP, so engineering samples ship in the package production will use.
What it is
Testing first silicon in the package it will ship in catches the problems a ceramic sample hides: mold stress, wire sweep, thermal paths that only exist in plastic. Large assembly houses rarely want a lot that small.
We run quick-turn plastic packaging at prototype and pilot volumes across the standard families below. Bring the die and the target package and we'll confirm the bond plan. Because the board team is on the same engagement, footprint and thermal pad questions get answered before the part is molded.
Inside the package
A wire-bonded QFN in section, the most common quick-turn plastic package: leadless, with an exposed pad underneath.
- 1Mold compoundEpoxy molded over the die and wires
- 2Bond wiresDie pads to the leads
- 3DieAttached to the exposed pad
- 4Exposed padSolders to the board for heat and ground
- 5LeadsFlat lands on the package edge
The plastic line
Fourteen steps from incoming wafer to packed parts, the same flow at prototype and pilot volume.
- 01Wafer in
- 02 · WGGrind
- 03 · WSSaw
- 04 · DADie attach
- 05 · ECEpoxy cure
- 06 · WBWire bond
- 07 · MDMold
- 08 · PMCPost-mold cure
- 09 · SPPlating
- 10 · TMTop mark
- 11 · TFTrim and form
- 12Test
- 13 · LSLead scan
- 14 · PKPack
Capabilities
- Package families
- QFN and DFN
- LQFP, plus eLQFP / HLQFP with heat slug
- SOP, SSOP, TSSOP, MSOP, eSOP
- DIP
- SOT and TO power packages
- Plastic BGA
- Around the package
- Wafer thinning, dicing, and die sort
- MSL preconditioning and reflow
- Final test (FT)
Plastic package catalog
Standard quick-turn plastic packages, small batch. Bring the die and the target package and we'll confirm the bond plan.
- SOT3, 5, 6 pins
- SOP8–32 pins
- QFN12–100 pins
- LQFP32–256 pins
- CDIP8–64 pins, ceramic
- BGA2–29 mm body
| Package | Pins | Body size |
|---|---|---|
| LQFP | 32–256 | 5×5 to 28×28 mm |
| eLQFP / HLQFP (heat slug) | 80, 128, 144, 176 | 12×12 to 20×20 mm |
| QFN | 12–100 | 2×2 to 10×10 mm, 12×12 mm |
| DFN | 8–16 | 2×3 to 5×6 mm |
| DIP | 8–48 | Standard |
| SOP | 8–32 | Standard |
| SSOP | 8–28 | Standard |
| TSSOP | 8–30 | Standard |
| eSOP | 8, 28 | Standard |
| MSOP | 8, 10 | Standard |
| SOT | 3, 5, 6 | Standard |
| TO | 90, 94, 220, 247, 251, 252, 263 | Standard |
Ceramic, COB, BGA, LGA, and MEMS packages are quoted per die and drawing.
BGA, LGA, SiP & MEMS
Array, system-in-package, and sensor packages, quick-turn.
| Family | Spec | Range |
|---|---|---|
| BGA | Body size | 2×2 to 29×29 mm |
| BGA | Mold thickness | 0.55 to 1.5 mm |
| BGA | Balls and pitch | From 0.2 mm balls at 0.4 mm pitch |
| LGA | Body size | 2×2 to 20×12 mm |
| LGA | Mold thickness | 0.55 to 1.5 mm |
| SiP | Configurations | Side by side, stacked die, IC plus passives |
| SiP | Assembly | Wire bond, flip chip, and SMT in one package |
| Bumping | Ball attach | Single die and wafers up to 6 in; balls from 60 µm |
| MEMS | Package style | Open-cavity or windowed; windows from 0.6 mm |
Ceramic BGA is built to drawing; see ceramic packaging.
Quality systems
ISO 9001
Quality management
ISO 14001
Environmental management
ISO 45001
Occupational health & safety
Packaging and test performed in ISO 9001, ISO 14001, and ISO 45001-certified facilities. Certificates available under NDA.
Common questions
- What plastic packages can you build in small batches?
- QFN, DFN, LQFP (including heat-slug variants), SOP, SSOP, TSSOP, MSOP, eSOP, DIP, SOT, TO, and BGA. Pin counts and body sizes are listed in the catalog on this page.
- Do you support exposed-pad and heat-slug packages?
- Yes. eLQFP / HLQFP in 80, 128, 144, and 176 pins, and eSOP in 8 and 28 pins.
- Can the same team design the board the part goes on?
- Yes. That's the point of running packaging inside an engineering studio: the package, footprint, and board are decided together.
More packaging & test
Packaging, Test & Failure Analysis
Quick-turn packaging, reliability qualification, and failure analysis built for NPI: one team from first silicon to a qualified part on a working board.
Quick-Turn Ceramic Packaging
Small-batch ceramic DIP, QFP, QFN, LCC, PGA, SiP, and BGA packages for engineering samples, MPW die, and parts that need to survive characterization.
Reliability Qualification & Electrical Test
HTOL, HAST, THB, temperature cycling, ESD, and latch-up for new parts, plus the burn-in boards and DUT cards to run them.
Failure Analysis & FIB Circuit Edit
FIB circuit edit down to 28nm, decap, delayering, and SEM imaging, so a first-silicon bug can be proven and patched before the next tape-out.
Package & Substrate Design
Package selection, substrate stack-up, ball maps, and SI, PI, and thermal co-simulation for flip-chip BGA, SiP, and chiplet designs.
Wafer Thinning, Dicing & Die Sort
Thinning to 50 µm, laser and blade dicing, SiC stealth dicing, GaAs laser dicing, and automated die sort for MPW, shuttle, and full wafers.